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Mots clés
Aluminum
Epitaxy
7550Pp
Nanoparticles
Acoustic
Epitaxial growth
Topological defects
RBS
Sputtering
Adsorbed layers
ADSORPTION DESORPTION HYSTERESIS
27Ald p&α
Hysteresis
Metal-insulator transition
6855Jk
Silicon Carbide
Zinc oxide
Transparent conductive oxide TCO
XPS
Ferromagnetic resonance
18O resonance
Pulsed laser deposition
3C-SiC
Ion beam analysis
Evaluation
Indium oxide
ALD
Channeling
Silicon
Acoustic propreties of solid
AC susceptibility
HfO2
Pb centers
Oxygen deficiency
Diffusion
Topological insulators
8140Ef
Passivation
18O
Al2O3
13C
27Alda
Adsorption Isotherms
Gold
Gallium oxide
Multilayer
Measurement
Interface defects
Auger electron spectroscopy AES
Stable isotopic tracing
Adsorption
Ageing
Magnetization curves
Defects
Isotopic Tracing
Nitridation
Silica
Energy loss
Thin film
Raman spectroscopy
EPR
Low energy electron diffraction LEED
PIXE
Nanostructures
Magnetic anisotropy
Kossel diffraction
17O
Annealing
Nickel
17Op
Thin films
Charge exchange
Alloys
Periodic multilayer
SiC
Ion implantation
Magnetic semiconductors
27Aldp
7630Lh
X-ray diffraction
Rutherford backscattering spectrometry RBS
GaMnAs
2H
AFM
Nuclear resonance profiling NRP
XRD
17Opp
NRP
7550Ee
Density functional theory
Atomic Layer Deposition ALD
15N
Growth
Nuclear reaction analysis
Photoluminescence
Capillary condensation
Silicon carbide
Aluminium
Alloy
Oxidation